8 datasets found
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Federal
Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
Department of Commerce —
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition... -
Federal
Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
National Institute of Standards and Technology —
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition... -
Federal
AM Bench 2022: IN718 Serial Sectioning and X-ray Computed Tomography Measurement Data
National Institute of Standards and Technology —
These sets of automated serial sectioning electron backscatter diffraction (EBSD) and X-ray computed tomography (XRCT) measurements were designed to produce spatially... -
Federal
Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"
Department of Commerce —
This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter... -
Federal
AM Bench 2022: Cross sectional microstructure of single laser tracks produced using different processing conditions and 2D arrays of laser tracks (pads) on solid plates of nickel alloy 718
Department of Commerce —
The following data files include microstructure measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM Bench 2022) AMB2022-03... -
Federal
AM Bench 2022: IN718 Serial Sectioning and X-ray Computed Tomography Measurement Data
Department of Commerce —
These sets of automated serial sectioning electron backscatter diffraction (EBSD) and X-ray computed tomography (XRCT) measurements were designed to produce spatially... -
Federal
Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"
National Institute of Standards and Technology —
This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter... -
Federal
AM Bench 2022: Cross sectional microstructure of single laser tracks produced using different processing conditions and 2D arrays of laser tracks (pads) on solid plates of nickel alloy 718
National Institute of Standards and Technology —
The following data files include microstructure measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM Bench 2022) AMB2022-03...
8 datasets found