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Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds

Metadata Updated: September 30, 2025

These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the Mathematica notebook used to process the images. Each of the 12 EBID mesa has 10 EBSPs collected at 20 kV and 10 kV, in addition to several longer line scans that step from the silicon substrate onto the EBID mesa.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

Dates

Metadata Created Date November 12, 2020
Metadata Updated Date September 30, 2025

Metadata Source

Harvested from Commerce Non Spatial Data.json Harvest Source

Additional Metadata

Resource Type Dataset
Metadata Created Date November 12, 2020
Metadata Updated Date September 30, 2025
Publisher National Institute of Standards and Technology
Maintainer
Identifier 77D21EEB60F37A2BE053245706819FDB1978
Language en
Data Last Modified 2018-10-17
Category Materials:Materials characterization, Nanotechnology:Nanomechanics, Nanotechnology:Nanometrology, Electronics:Semiconductors
Public Access Level public
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id 9a66ce4b-8421-45af-a3b7-3b6112a86006
Harvest Source Id bce99b55-29c1-47be-b214-b8e71e9180b1
Harvest Source Title Commerce Non Spatial Data.json Harvest Source
Homepage URL https://data.nist.gov/od/id/77D21EEB60F37A2BE053245706819FDB1978
License https://www.nist.gov/open/license
Program Code 006:045
Source Datajson Identifier True
Source Hash ec185e35a9557b32f9d7ff8b0cfee9ad95d7bcde4cf2a1856a66cd73e7fda030
Source Schema Version 1.1

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