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These sets of automated serial sectioning electron backscatter diffraction (EBSD) and X-ray computed tomography (XRCT) measurements were designed to produce spatially registered, multi-modal...
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These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the Mathematica notebook...
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This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter Diffraction - Measurement of...
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The following data files include microstructure measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM Bench 2022) AMB2022-03 set of benchmarks. These...
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