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Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds

Metadata Updated: July 29, 2022

These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the Mathematica notebook used to process the images. Each of the 12 EBID mesa has 10 EBSPs collected at 20 kV and 10 kV, in addition to several longer line scans that step from the silicon substrate onto the EBID mesa.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

Dates

Metadata Created Date March 11, 2021
Metadata Updated Date July 29, 2022

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date March 11, 2021
Metadata Updated Date July 29, 2022
Publisher National Institute of Standards and Technology
Maintainer
Identifier 77D21EEB60F37A2BE053245706819FDB1978
Language en
Data Last Modified 2018-10-17
Category Materials:Materials characterization, Nanotechnology:Nanomechanics, Nanotechnology:Nanometrology, Electronics:Semiconductors
Public Access Level public
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id 59555e05-dc04-42d1-8338-93d3cf795878
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL https://data.nist.gov/od/id/77D21EEB60F37A2BE053245706819FDB1978
License https://www.nist.gov/open/license
Program Code 006:045
Source Datajson Identifier True
Source Hash 593bbff6e71d93b84622fbca53ee925badbd45b7
Source Schema Version 1.1

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