Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
Access & Use Information
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20kV-mesas.zip
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afmOfMesas.zip
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10kV-lineScans.zip
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10kV-mesas.zip
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readme.txt
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Web Resourceapplication/mathematica
fibColoring.nb
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DOI Access to Supporting Data for Selected...HTML
DOI Access to Supporting Data for Selected Area Beam Induced Deposition of Pt...
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Dates
Metadata Created Date | March 11, 2021 |
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Metadata Updated Date | July 29, 2022 |
Metadata Source
- Data.json Data.json Metadata
Harvested from NIST
Additional Metadata
Resource Type | Dataset |
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Metadata Created Date | March 11, 2021 |
Metadata Updated Date | July 29, 2022 |
Publisher | National Institute of Standards and Technology |
Maintainer | |
Identifier | 77D21EEB60F37A2BE053245706819FDB1978 |
Language | en |
Data Last Modified | 2018-10-17 |
Category | Materials:Materials characterization, Nanotechnology:Nanomechanics, Nanotechnology:Nanometrology, Electronics:Semiconductors |
Public Access Level | public |
Bureau Code | 006:55 |
Metadata Context | https://project-open-data.cio.gov/v1.1/schema/data.json |
Schema Version | https://project-open-data.cio.gov/v1.1/schema |
Catalog Describedby | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
Harvest Object Id | 59555e05-dc04-42d1-8338-93d3cf795878 |
Harvest Source Id | 74e175d9-66b3-4323-ac98-e2a90eeb93c0 |
Harvest Source Title | NIST |
Homepage URL | https://data.nist.gov/od/id/77D21EEB60F37A2BE053245706819FDB1978 |
License | https://www.nist.gov/open/license |
Program Code | 006:045 |
Source Datajson Identifier | True |
Source Hash | 593bbff6e71d93b84622fbca53ee925badbd45b7 |
Source Schema Version | 1.1 |
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