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Federal
Nexus-Experiment: an XML schema for describing data collected from electron microscopes
National Institute of Standards and Technology —
We share an XML Schema for describing data collected from a laboratory experiment in an organized way that attempts to communicate scientific intent and the phased... -
Federal
Optical scattering measurements and simulation data for one-dimensional (1-D) patterned periodic sub-wavelength features
National Institute of Standards and Technology —
This data set consists of both measured and simulated optical intensities scattered off periodic line arrays, with simulations based upon an average geometric model... -
Federal
Sample code and data for "Accurate localization microscopy by intrinsic aberration calibration"
National Institute of Standards and Technology —
Sample data and code for "Accurate localization microscopy by intrinsic aberration calibration", Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, and... -
Federal
Data associated with manuscript "Linearizing the vertical scale of an interferometric microscope and its effect on step-height measurement"
National Institute of Standards and Technology —
This repository contains all of the data used in the manuscript "Linearizing the vertical scale of an interferometric microscope and its effect on step-height... -
Federal
Results of single-cell and single-transcript measurements collected for Bias and Resolvability Attribution using Split Samples (BRASS) study
National Institute of Standards and Technology —
Results of single-cell and single-transcript measurements collected as part of the Bias and Resolvability Attribution using Split Samples (BRASS) study. Each file is... -
Federal
Data for A Dual Mode Brillouin/Low-Frequency Raman Spectroscopy Microscope for Local Mechanical Property Imaging for Semiconductor Packaging Materials
National Institute of Standards and Technology —
The processed spectroscopic and experimental conditions (as applicable) data which are used to construct each figure is provided. -
Federal
Data Publication: Differential interference contrast microscopy from a cross section of a fractured ASTM 1008 steel
National Institute of Standards and Technology —
This dataset contains 42 individual images that are part of a single sample. The individual images can be combined into a single image via image stitching. These data...