Sample code and data for "Accurate localization microscopy by intrinsic aberration calibration"
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DOI Access for Sample code and data for "Accurate Localization Microscopy by Intrinsic Aberration Calibration"
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Sample code and data for “Accurate localization microscopy by intrinsic aberration calibration”
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Sample data and code for "Accurate localization microscopy by intrinsic aberration calibration"
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SHA256 File for Sample code and data for “Accurate localization microscopy by intrinsic aberration calibration”
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SHA256 File for Sample data and code for "Accurate localization microscopy by intrinsic aberration calibration"
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[ "006:55" ] |
| contactPoint |
{ "fn": "Samuel Stavis", "hasEmail": "mailto:samuel.stavis@nist.gov" } |
| description | Sample data and code for "Accurate localization microscopy by intrinsic aberration calibration", Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, and Samuel M. Stavis, Nature Communications X, Y (2021). For use in MATLAB. |
| distribution |
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| identifier | ark:/88434/mds2-2376 |
| issued | 2021-03-16 |
| keyword |
[ "MEMS", "intrinsic aberration", "localization", "microscopy", "particle tracking" ] |
| language |
[ "en" ] |
| license | https://www.nist.gov/open/license |
| modified | 2021-03-01 00:00:00 |
| programCode |
[ "006:045" ] |
| publisher |
{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" } |
| theme |
[ "Mathematics and Statistics:Image and signal processing", "Mathematics and Statistics:Uncertainty quantification", "Metrology:Optical, photometry, and laser metrology", "Nanotechnology:Nanomechanics" ] |
| title | Sample code and data for "Accurate localization microscopy by intrinsic aberration calibration" |
