Dataset - Catalog

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3 datasets found

Federal

Calibration Data for Wafer 2 of SRM 3461 - MEMS Cantilever Stiffness

National Institute of Standards and Technology —

SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM...
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Federal

Harsh Environment Sensors for Geothermal Applications

Department of Energy —

Technical papers detailing the development of harsh environment sensors for geothermal applications. Principle Investigator is Prof. Albert P. Pisano (University of...
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Federal

Sample code and data for "Accurate localization microscopy by intrinsic aberration calibration"

National Institute of Standards and Technology —

Sample data and code for "Accurate localization microscopy by intrinsic aberration calibration", Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, and...

3 datasets found

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