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Data for A Dual Mode Brillouin/Low-Frequency Raman Spectroscopy Microscope for Local Mechanical Property Imaging for Semiconductor Packaging Materials

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Catalog Last Checked: August 02, 2025 at 03:55 PM | Dataset Last Updated: February 27, 2025
The processed spectroscopic and experimental conditions (as applicable) data which are used to construct each figure is provided.

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