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Federal
NIST Special Database 300 Uncompressed Plain and Rolled Images from Fingerprint Cards
National Institute of Standards and Technology —
NIST, working with the FBI, has digitized 888 inked fingerprint arrest cards that were in various physical conditions, from pristine to badly damaged and faded, and... -
Federal
Detection Limits for SEM Image Segmentation
National Institute of Standards and Technology —
The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics....- zip file with six subfolders containing SEM image collections
- zip file contains mask images and the initial intensity image with max contrast and min noise
- zip contains three folders with TensorFlow AI models
- zip file contains a folder with image quality metrics and a folder with AI model accuracy
- URL
- HTML
- 1 more in dataset
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Federal
Complex Document Information Processing (CDIP) dataset
National Institute of Standards and Technology —
This dataset is called the "IIT CDIP collection". "CDIP" stands for "Complex Document Information Processing" and "IIT" stands for "Illinois Institute of Technology"... -
Federal
High-Resolution X-ray computed tomography (XCT) image data set of additively manufactured cobalt chrome samples produced with varying laser powder bed fusion processing parameters
National Institute of Standards and Technology —
This data contains X-ray computed tomography (XCT) reconstructed slices of additively manufactured cobalt chrome samples produced with varying laser powder bed fusion... -
Federal
DICOM files for "RECIST and Volumetric CT Measurements of Injected-Water Phantoms" by ZH Levine, HH Chen-Mayer, AP Peskin, and AL Pintar.
National Institute of Standards and Technology —
DICOM files are given for 11 CT scans which were used in a research article. Each scan contains about 1250 slices with 512x512 gray scale images, each in its own... -
Federal
Training and Validation Datasets for Neural Network to Fill in Missing Data in EBSD Maps
National Institute of Standards and Technology —
This dataset consists of the synthetic electron backscatter diffraction (EBSD) maps generated for the paper, titled "Hybrid Algorithm for Filling in Missing Data in... -
Federal
Experimental test of the intrinsic dimensionality of Hounsfield unit measurements: the CT data
National Institute of Standards and Technology —
We present the data supporting "Experimental test of the intrinsic dimensionality of Hounsfield unit measurements" (In preparation). In this study, we passed 34... -
Federal
NIST Special Database 302 Nail to Nail (N2N) Fingerprint Challenge
National Institute of Standards and Technology —
In September 2017, the Intelligence Advanced Research Projects Activity (IARPA) held a data collection as part of its Nail to Nail (N2N) Fingerprint Challenge.... -
Federal
Process-structure-properties investigations for laser powder bed fused IN718 in the as-built condition
National Institute of Standards and Technology —
This data repository provides a central location for a body of work using one build of nickel-based alloy 718 (IN718) material and resulted in three different... -
Federal
Characterization of zinc carboxylates in an oil paint test panel [dataset]
National Institute of Standards and Technology —
This dataset contains X-ray EDS (energy dispersive spectroscopy), FTIR (Fourier transform infrared spectroscopy), and DART-MS (Direct analysis in real time mass... -
Federal
Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"
National Institute of Standards and Technology —
This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter... -
Federal
Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): 3D Scan Strategies
National Institute of Standards and Technology —
This dataset includes the files pertaining to a 3D additive manufacturing build performed on the Additive Manufacturing Metrology Testbed (AMMT) by Ho Yeung on July... -
Federal
A Data-Driven Approach to Complex Voxel Predictions in Grayscale Digital Light Processing Additive Manufacturing Using U-nets and Generative Adversarial Networks
National Institute of Standards and Technology —
Digital light processing (DLP) vat photopolymerization (VP) additive manufacturing (AM) uses patterned UV light to selectively cure a liquid photopolymer into a solid... -
Federal
FIB SEM image data set of Caenorhabditis elegans exposed to 60 nm Au nanoparticles
National Institute of Standards and Technology —
This folder contains image data sets from 14 separate serial sectioning sessions. The entire data folder consists of 1379 8 bit tif images and is 47.3 GB in size.... -
Federal
Single-track laser scan cross-sectional micrographs on IN625 and IN718 bare plates with melt pool depth and width measurements
National Institute of Standards and Technology —
Single-track laser scans were produced with Yb-fiber lasers on bare plates of IN625 and IN718 using three different laser powder bed fusion machines. The laser power,... -
Federal
AM Bench 2022 challenge Macroscale Tensile Tests at Different Orientations (CHAL-AMB2022-04-MaTTO)
National Institute of Standards and Technology —
Additively manufactured (AM) laser powder bed fusion (PBF-L) Inconel 625 blocks were built with two different scan strategies: XY and X-only. 96 tensile specimens... -
Federal
AM Bench 2022 Microstructure Measurements for IN718 3D builds
National Institute of Standards and Technology —
The following data files include microstructure measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM-Bench 2022) AMB2022-01... -
Federal
Process Monitoring Dataset from the Additive Manufacturing Metrology Testbed (AMMT): RHF Experiment
National Institute of Standards and Technology —
This dataset includes the files pertaining to a 3D additive manufacturing experiment performed on the Additive Manufacturing Metrology Testbed (AMMT) by Ho Yeung on... -
Federal
Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
National Institute of Standards and Technology —
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition... -
Federal
A Materials Properties Dataset for Elastomeric Foam Impact Mitigating Materials
National Institute of Standards and Technology —
The database includes mechanical data for structure-properties relationships and mechanical modeling of elastic impact protection foams from a variety of imaging...