9 datasets found
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Federal
NIST X-ray Photoelectron Spectroscopy Database - SRD 20
National Institute of Standards and Technology —
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for... -
Federal
NIST Electron Effective-Attenuation-Length Database - SRD 82
National Institute of Standards and Technology —
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron... -
Federal
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
National Institute of Standards and Technology —
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-... -
Federal
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
Department of Commerce —
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-... -
Federal
NIST Electron Effective-Attenuation-Length Database - SRD 82
Department of Commerce —
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron... -
Federal
NIST Photoionization of CO2 (ARPES) Database - SRD 119
National Institute of Standards and Technology —
CO2 is studied using dispersed synchrotron radiation in the 650 Å and 840 Å spectral region. The vibrationally resolved photoelectron spectra are analyzed to generate... -
Federal
NIST Photoionization of CO2 (ARPES) Database - SRD 119
Department of Commerce —
CO2 is studied using dispersed synchrotron radiation in the 650 Å and 840 Å spectral region. The vibrationally resolved photoelectron spectra are analyzed to generate... -
Federal
NIST X-ray Photoelectron Spectroscopy Database - SRD 20
Department of Commerce —
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for... -
Federal
Reflectance data from figures in: Using X-ray spectrum of carbon in electron microprobe analysis to determine thermal maturity of organic matter in mudstones
Department of the Interior —
Conventional methods of assessing organic matter (OM) thermal maturity have limitations and often fail to reflect the geochemical heterogeneity between individual...
9 datasets found