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Federal
Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet
Department of Commerce —
The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data... -
Federal
Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet
National Institute of Standards and Technology —
The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data... -
Federal
Data for "Characterizing Interconnects to 325 GHz" to be submitted to "Transactions on Microwave Theory and Techniques"
National Institute of Standards and Technology —
Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization... -
Federal
Data for "Characterizing Interconnects to 325 GHz" to be submitted to "Transactions on Microwave Theory and Techniques"
Department of Commerce —
Included here are figures and other relevant data from the paper "Characterizing Interconnects to 325 GHz". Abstract: We developed an interconnect characterization...