Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet
The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.
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Test S-parameter data for on-wafer calibrations from 10 MHz to 110 GHz
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[ "006:55" ] |
| contactPoint |
{ "fn": "Nate Orloff", "hasEmail": "mailto:nathan.orloff@nist.gov" } |
| description | The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance. |
| distribution |
[ { "title": "Test S-parameter data for on-wafer calibrations from 10 MHz to 110 GHz", "mediaType": "application/x-zip-compressed", "description": "Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.", "downloadURL": "https://data.nist.gov/od/ds/mds2-3404/V2.zip" }, { "mediaType": "text/plain", "downloadURL": "https://data.nist.gov/od/ds/mds2-3404/3404_README.txt" } ] |
| identifier | ark:/88434/mds2-3404 |
| issued | 2024-08-26 |
| keyword |
[ "110 GHz", "Calnet", "S-parameter", "SOLT", "check standards", "impedance", "multiline TRL", "on-wafer", "probes", "propagation constant", "sapphire", "series resistor", "vector network analyzer" ] |
| landingPage | https://data.nist.gov/od/id/mds2-3404 |
| language |
[ "en" ] |
| license | https://www.nist.gov/open/license |
| modified | 2024-07-10 00:00:00 |
| programCode |
[ "006:045" ] |
| publisher |
{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" } |
| theme |
[ "Advanced Communications:Wireless (RF)", "Electronics:Electromagnetics", "Electronics:Semiconductors", "Metrology:Electrical/electromagnetic metrology" ] |
| title | Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet |
