Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Skip to content
  • Feedback

    • Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet

    Metadata Updated: March 14, 2025

    The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p, Ref_L1_g25_HF_0.s2p, Ref_S1_g25_HF_0.s2p, Ref_Rg_g25_HF_0.s2p, Ref_Og_g25_HF_0.s2p, Ref_L2_g25_HF_0.s2p, Ref_L3_g25_HF_0.s2p, Ref_L4_g25_HF_0.s2p, Ref_L5_g25_HF_0.s2p, Ref_L6_g25_HF_0.s2p, Ref_L7_g25_HF_0.s2p, Ref_L8_g25_HF_0.s2p, Ref_L9_g25_HF_0.s2p). Data is in an *.s2p format. The format is "# GHZ S RI R 50". Frequency is GHz, data is S-parameters as real and imaginary pairs to a reference impedance of 50 Ohms. The effective permittivity data is a frequency real part of permittivity and imaginary part of permittivity. The effective permittivity data is a frequency real part of characteristic impedance and imaginary part of characteristic impedance.

    Access & Use Information

    Public: This dataset is intended for public access and use. License: See this page for license information.

    Downloads & Resources

    Dates

    Metadata Created Date September 11, 2024
    Metadata Updated Date March 14, 2025
    Data Update Frequency irregular

    Metadata Source

    Harvested from NIST

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date September 11, 2024
    Metadata Updated Date March 14, 2025
    Publisher National Institute of Standards and Technology
    Maintainer
    Identifier ark:/88434/mds2-3404
    Data First Published 2024-08-26
    Language en
    Data Last Modified 2024-07-10 00:00:00
    Category Advanced Communications:Wireless (RF), Electronics:Electromagnetics, Electronics:Semiconductors, Metrology:Electrical/electromagnetic metrology
    Public Access Level public
    Data Update Frequency irregular
    Bureau Code 006:55
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Harvest Object Id 030d89ba-fbfa-4763-98e9-7c65e1ac36c3
    Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
    Harvest Source Title NIST
    Homepage URL https://data.nist.gov/od/id/mds2-3404
    License https://www.nist.gov/open/license
    Program Code 006:045
    Source Datajson Identifier True
    Source Hash 62a2d95f172181f1040af103000f4ccb4187e54b45baa1f2fee3e74e45d30f17
    Source Schema Version 1.1

    Didn't find what you're looking for? Suggest a dataset here.