Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet
Access & Use Information
Downloads & Resources
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Test S-parameter data for on-wafer...ZIP
Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p,...
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Text FileTEXT
3404_README.txt
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Landing PageLanding Page
Dates
| Metadata Created Date | September 30, 2025 |
|---|---|
| Metadata Updated Date | September 30, 2025 |
| Data Update Frequency | irregular |
Metadata Source
- Data.json Data.json Metadata
Harvested from Commerce Non Spatial Data.json Harvest Source
Additional Metadata
| Resource Type | Dataset |
|---|---|
| Metadata Created Date | September 30, 2025 |
| Metadata Updated Date | September 30, 2025 |
| Publisher | National Institute of Standards and Technology |
| Maintainer | |
| Identifier | ark:/88434/mds2-3404 |
| Data First Published | 2024-08-26 |
| Language | en |
| Data Last Modified | 2024-07-10 00:00:00 |
| Category | Advanced Communications:Wireless (RF), Electronics:Electromagnetics, Electronics:Semiconductors, Metrology:Electrical/electromagnetic metrology |
| Public Access Level | public |
| Data Update Frequency | irregular |
| Bureau Code | 006:55 |
| Metadata Context | https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld |
| Schema Version | https://project-open-data.cio.gov/v1.1/schema |
| Catalog Describedby | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
| Harvest Object Id | 6e96fa23-7740-413d-889f-804b17edbba7 |
| Harvest Source Id | bce99b55-29c1-47be-b214-b8e71e9180b1 |
| Harvest Source Title | Commerce Non Spatial Data.json Harvest Source |
| Homepage URL | https://data.nist.gov/od/id/mds2-3404 |
| License | https://www.nist.gov/open/license |
| Program Code | 006:045 |
| Source Datajson Identifier | True |
| Source Hash | fc9fef1f322008029a6ae16270d6a4cdc1ad042b2e66e43b91aac222f1300ff3 |
| Source Schema Version | 1.1 |
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