4 datasets found
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Federal
Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz
National Institute of Standards and Technology —
Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz"We investigated the...- Comments lines have a % in front of them, data is space delimited.
- Comment lines start with a % sign. Data lines are space delimited
- Comment lines start with a % symbol. Data lines are space delimited
- Commented lines start with a % sign. Data lines are space delimited. Text broken up into three sections. One for the histogram, one for the Gaussian curve, and one for the measured data
- Plain text descriptions of the data files. No specific formatting.
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Federal
On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz
National Institute of Standards and Technology —
data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters...- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are three sections. 1. Measured capacitance of Tech. 1 and Tech. 2 series capacitors. 2. Simulated capacitance of the the Tech 1. series capacitor. 3. Simulated capacitance of the Tech 2. series capacitor. Commented lines start with a % sign. Data lines are space delimited.
- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are three sections. 1. Measured capacitance of Tech. 1 and Tech. 2 shunt capacitors. 2. Simulated capacitance of the the Tech 1. shunt capacitor. 3. Simulated capacitance of the Tech 2. shunt capacitor. Commented lines start with a % sign. Data lines are space delimited.
- 4 more in dataset
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Federal
Measuring the permittivity tensor of anisotropic DyScO3 to 110 GHz
National Institute of Standards and Technology —
DyScO3 (DSO) serves as a substrate on which to grow epitaxial thin films with extraordinary materials physics. The film properties are determined by the biaxial in-... -
Federal
Measuring the permittivity of Fused Silica with planar on-wafer structures up to 325 GHz
National Institute of Standards and Technology —
Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of...
4 datasets found