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On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz

Metadata Updated: March 12, 2024

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was not used in calibration, and the simulated and calibrated S-parameters for series and shunt capacitors for both technology 1 and technology 2. It also contains the simulated and extracted capacitance from these S-parameters of the series and shunt capacitors. It contains the simulated and extracted capacitance for the shunt capacitor from one site in technology 1 and 95% prediction intervals (uncertainties) from electronic variation in the vector network analyzer (VNA), probe placement error, and the capacitance per unit length correction variation. Finally, it contains the extracted capacitance for multiple sites for the shunt capacitor in technology 1. All simulated S-parameters obtained using a 2.5D method of moments commercial solver. Simulated capacitance obtained from the simulated S-parameters.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

Dates

Metadata Created Date March 12, 2024
Metadata Updated Date March 12, 2024
Data Update Frequency irregular

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date March 12, 2024
Metadata Updated Date March 12, 2024
Publisher National Institute of Standards and Technology
Maintainer
Identifier ark:/88434/mds2-3151
Data First Published 2024-02-26
Language en
Data Last Modified 2024-01-23 00:00:00
Category Electronics:Semiconductors
Public Access Level public
Data Update Frequency irregular
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id d1492aaa-6718-4252-88d5-0982540d975a
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL https://data.nist.gov/od/id/mds2-3151
License https://www.nist.gov/open/license
Program Code 006:045
Source Datajson Identifier True
Source Hash 1ef2c65edea5410f92023f40c94e263269afc491e72ebba4808efcba2b2b1470
Source Schema Version 1.1

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