README
URL: https://data.nist.gov/od/ds/mds2-3151/3151_README.txt
3151_README.txt
Source: On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz
About this Resource
| Last updated | unknown |
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| Created | unknown |
| Name | README |
| Format | Web Resource |
| License | other-license-specified |
| Created | 2 years ago |
| Media type | text/plain |
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| id | 47ac43d8-ac38-47cd-a7fa-59d0cbbc9463 |
| metadata modified | 2 years ago |
| package id | 7bac98b5-02f4-4f9f-8d84-1fe2cfee2fa4 |
| position | 8 |
| state | active |
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