Data Catalog

• Federal

  Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds

  National Institute of Standards and Technology —

  These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition...

  • ZIP
  • TEXT
  • ZIP
  • ZIP
  • ZIP
  • TEXT
  • 8 more in dataset
• Federal

  Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"

  Department of Commerce —

  This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter...

  • BMP
  • JPEG
  • BIN
  • BMP
  • BMP
  • BMP
  • 329 more in dataset
• Federal

  Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"

  National Institute of Standards and Technology —

  This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter...

  • BMP
  • JPEG
  • BIN
  • BMP
  • BMP
  • BMP
  • 329 more in dataset
• Federal

  Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds

  Department of Commerce —

  These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition...

  • ZIP
  • TEXT
  • ZIP
  • ZIP
  • ZIP
  • TEXT
  • 8 more in dataset

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