4 datasets found
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Federal
Measuring the permittivity of Fused Silica with planar on-wafer structures up to 325 GHz
National Institute of Standards and Technology —
Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of... -
Federal
Measuring the permittivity tensor of anisotropic DyScO3 to 110 GHz
National Institute of Standards and Technology —
DyScO3 (DSO) serves as a substrate on which to grow epitaxial thin films with extraordinary materials physics. The film properties are determined by the biaxial in-... -
Federal
Measuring the permittivity of Fused Silica with planar on-wafer structures up to 325 GHz
Department of Commerce —
Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of... -
Federal
Measuring the permittivity tensor of anisotropic DyScO3 to 110 GHz
Department of Commerce —
DyScO3 (DSO) serves as a substrate on which to grow epitaxial thin films with extraordinary materials physics. The film properties are determined by the biaxial in-...
4 datasets found