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Federal
NIST Synthetic Polymer MALDI Methods Database
National Institute of Standards and Technology —
This resource consists of methods for matrix-assisted laser desorption ionization (MALDI) mass spectrometry on a wide variety of synthetic polymers. The methods are... -
Federal
NIST Stopping-Power & Range Tables for Electrons, Protons, and Helium Ions - SRD 124
National Institute of Standards and Technology —
The databases ESTAR, PSTAR, and ASTAR calculate stopping-power and range tables for electrons, protons, or helium ions. Stopping-power and range tables can be... -
Federal
IUPAC/NIST Solubility Database - SRD 106
National Institute of Standards and Technology —
The IUPAC Solubility Data Series Volumes 1-103 (1979 to 2014) are made available online. Volumes 1-19 and 39-65 are available as scanned and OCR'd single PDF files.... -
Federal
NIST Chemical Kinetics Database
National Institute of Standards and Technology —
The NIST Chemical Kinetics Database includes essentially all reported kinetics results for thermal gas-phase chemical reactions. The database is designed to be... -
Federal
NIST Reference Fluid Thermodynamic and Transport Properties Database (REFPROP) Version 9 - SRD 23
National Institute of Standards and Technology —
**NOTICE: THIS VERSION OF REFPROP (9.1) has been superseded by Version 10: https://doi.org/10.18434/T4/1502528 ** NIST Standard Reference Data 23 contains revised... -
Federal
NIST/ASME Steam Properties Database - SRD 10
National Institute of Standards and Technology —
The NIST/ASME Steam Properties Database is based upon the International Association for the Properties of Water and Steam (IAPWS) 1995 formulation for general and... -
Federal
NIST Thermophysical Properties of Hydrocarbon Mixtures Database- SRD 4
National Institute of Standards and Technology —
SUPERTRAPP is an interactive computer program for predicting thermodynamic and transport properties of pure fluids and fluid mixtures containing up to 20 components.... -
Federal
NIST Database of the Thermophysical Properties of Gases Used in the Semiconductor Industry
National Institute of Standards and Technology —
The 1999 Semiconductor Industry Association (SIA) International Technology Roadmap for Semiconductors (ITRS) identifies 'Equipment Modeling' as first in a list of... -
Federal
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
National Institute of Standards and Technology —
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-... -
Federal
NIST Special Database 300 Uncompressed Plain and Rolled Images from Fingerprint Cards
National Institute of Standards and Technology —
NIST, working with the FBI, has digitized 888 inked fingerprint arrest cards that were in various physical conditions, from pristine to badly damaged and faded, and... -
Federal
Design, Manufacturing, and Inspection Data for a Box Assembly
National Institute of Standards and Technology —
To better understand and address the challenges faced in linking all stages of a manufacturing and design process, an investigative fabrication process was designed... -
Federal
NIST Atomic Energy Levels and Spectra Bibliographic Database
National Institute of Standards and Technology —
References contained in this database are from Bibliography on Atomic Energy Levels and Spectra, NBS Special Publication 363 and Supplements, as well as current... -
Federal
NIST Electron-Impact Ionization Cross Section Database - SRD 107
National Institute of Standards and Technology —
This is a database of total ionization cross sections of atoms and molecules by electron impact. The cross sections were calculated using the Binary-Encounter-Bethe... -
Federal
NIST Handprinted Forms and Characters - NIST Special Database 19
National Institute of Standards and Technology —
Special Database 19 contains NIST's entire corpus of training materials for handprinted document and character recognition. It publishes Handprinted Sample Forms from... -
Federal
NIST Mugshot Identification Database (MID) - NIST Special Database 18
National Institute of Standards and Technology —
This database was distributed for use in development and testing of automated mugshot identification systems. The database consists of one zipped file, containing a... -
Federal
NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100
National Institute of Standards and Technology —
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra... -
Federal
NDRL/NIST Solution Kinetics Database - SRD 40
National Institute of Standards and Technology —
The NDRL/NIST Solution Kinetics Database contains data on rate constants for solution-phase chemical reactions. The database is designed to be searched by reactants,... -
Federal
NIST Visible Cement Dataset
National Institute of Standards and Technology —
Dataset of 3-D microstructures obtained by x-ray microtomography at the ESRF facility in Grenoble, France. Materials investigated including hydrating cement paste,... -
Federal
Dataset of channels and received IEEE 802.11ay signals for sensing applications in the 60GHz band
National Institute of Standards and Technology —
The dataset can be used to develop and test algorithms for communication and sensing in the 60GHz band. The dataset consists of synthetically generated indoor mm-wave...