Data Catalog

• Federal

  Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds

  Department of Commerce —

  These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition...

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  • 8 more in dataset
• Federal

  Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"

  Department of Commerce —

  This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter...

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  • 329 more in dataset
• Federal

  AM Bench 2022: Cross sectional microstructure of single laser tracks produced using different processing conditions and 2D arrays of laser tracks (pads) on solid plates of nickel alloy 718

  Department of Commerce —

  The following data files include microstructure measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM Bench 2022) AMB2022-03...
• Federal

  AM Bench 2022: IN718 Serial Sectioning and X-ray Computed Tomography Measurement Data

  Department of Commerce —

  These sets of automated serial sectioning electron backscatter diffraction (EBSD) and X-ray computed tomography (XRCT) measurements were designed to produce spatially...

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