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Federal
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue - like brake dust and fireworks.
National Institute of Standards and Technology —
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue -... -
Federal
Dataset for Establishing a Reference Focal Plane Using Machine Learning and Beads for Brightfield Imaging
National Institute of Standards and Technology —
This dataset consists of sets of images corresponding to the data sets 1-8 described in Table 1 in the manuscript "Establishing a Reference Focal Plane Using Machine...