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#1 Federal
On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: January 23, 2024
data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz" This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...
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Search relevance: 1.00 | Views last month: 2 | Catalog Last Checked: September 02, 2026 at 07:18 PM
#2 Federal
Data for "Distributed contactless interconnects for millimeter-wave heterogeneous integration"
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: December 15, 2022
Included here are figures and other relevant data from the paper "Distributed contactless interconnects for millimeter-wave heterogeneous integration", submitted to TMTT Letters. Abstract:...
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Search relevance: 1.00 | Views last month: 1 | Catalog Last Checked: August 03, 2026 at 03:51 AM
#3 Federal
Data for "A distributed theory for contactless interconnects at terahertz frequencies"
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: December 15, 2022
Included here are figures and other relevant data from the paper "A distributed theory for contactless interconnects at terahertz frequencies". Abstract: Here we test a multimodal model for...
- TIFF
- TXT
- TIFF
- TIFF
- XLSX
- XLSX
Search relevance: 1.00 | Views last month: 1 | Catalog Last Checked: August 03, 2026 at 03:51 AM

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On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz

Data for "Distributed contactless interconnects for millimeter-wave heterogeneous integration"

Data for "A distributed theory for contactless interconnects at terahertz frequencies"