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EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with...
Search relevance: 1.00 | Views last month: 4 | Catalog Last Checked: August 02, 2025 at 03:04 PM -
Automated particle analysis (SEM/EDS) data from samples known to have been exposed to gunshot residue and from samples occasionally mistaken for gunshot residue - like brake dust and fireworks....
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: August 02, 2025 at 02:35 PM
