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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: June 29, 2023

Fused silica has become an interesting alternative to silicon for millimeter-wave (mmWave) applications. Unfortunately, there are few reports on the measurement of fused silica’s permittivity...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: June 08, 2023

Data published in paper "Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz" We investigated the effect of two uncertainty...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: May 22, 2023

DyScO3 (DSO) serves as a substrate on which to grow epitaxial thin films with extraordinary materials physics. The film properties are determined by the biaxial in-plane strain due to DyScO3's...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: January 23, 2024

data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz" This dataset contains the calibrated scattering parameters (S-parameters) of a thru that was...

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• Organization: National Institute of Standards and Technology
• Dataset Last Updated: February 12, 2026

This data repository is the basis for the figures in the manuscript "A Fabrication-motivated Model for Improving Simulations of On-wafer Transmission Lines", F. Bergmann et al. (2026), accepted...

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