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SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM certificate reports values and...
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Sample data and code for "Accurate localization microscopy by intrinsic aberration calibration", Craig R. Copeland, Craig D. McGray, B. Robert Ilic, Jon Geist, and Samuel M. Stavis, Nature...
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Technical papers detailing the development of harsh environment sensors for geothermal applications. Principle Investigator is Prof. Albert P. Pisano (University of California, Berkeley)....
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: March 23, 2026 at 09:38 PM