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    • X-ray Metrology for the Semiconductor Industry Tutorial

    Metadata Updated: September 30, 2025

    Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry

    Access & Use Information

    Public: This dataset is intended for public access and use. License: See this page for license information.

    Downloads & Resources

    Dates

    Metadata Created Date November 12, 2020
    Metadata Updated Date September 30, 2025

    Metadata Source

    Harvested from Commerce Non Spatial Data.json Harvest Source

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date November 12, 2020
    Metadata Updated Date September 30, 2025
    Publisher National Institute of Standards and Technology
    Maintainer
    Identifier 7CE906EBFAD7231EE0532457068153892009
    Language en
    Data Last Modified 2018-12-01
    Category Nanotechnology:Nanoelectronics, Metrology:Dimensional metrology, Electronics:Semiconductors, Nanotechnology:Nanometrology
    Public Access Level public
    Bureau Code 006:55
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Harvest Object Id 00c99de1-a95d-4e06-a96b-da967ec79340
    Harvest Source Id bce99b55-29c1-47be-b214-b8e71e9180b1
    Harvest Source Title Commerce Non Spatial Data.json Harvest Source
    Homepage URL https://www.nist.gov/mml/materials-science-and-engineering-division/polymers-processing-group/x-ray-metrology
    License https://www.nist.gov/open/license
    Program Code 006:045
    Source Datajson Identifier True
    Source Hash 2652f92f7b2ad07971c1b0dc9ab2071b242037b1011198f9832d23f8ee319c80
    Source Schema Version 1.1

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