Imean_L100P300_exp.csv
URL: https://data.nist.gov/od/ds/mds2-2290/Imean_L100P300_exp.csv
9 x 84 matrix of measurements determined from repeated measurements of the intensities scattered off the nine measured "L100P300" targets, specifically within nine dies on a single wafer. Each row of intensities corresponds to a single die. These intensities are normalized and unit-less.
About this Resource
Last updated | unknown |
---|---|
Created | unknown |
Name | Imean_L100P300_exp.csv |
Format | Web Resource |
License | other-license-specified |
Created | 5 years ago |
Media type | application/vnd.ms-excel |
has views | False |
id | 4500ba88-ece5-4cbd-becd-a107a5651ed1 |
metadata modified | 5 years ago |
package id | 16eb9396-748a-4d9e-827a-3d1a4a3968ed |
position | 5 |
state | active |
tracking summary | {'total': 0, 'recent': 0} |