OIG investigation into Alleged time and...
Department of Commerce OIG investigation into alleged time and attendance abuse by a Patent Examiner
Source: OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner
About this Resource
| Last updated | unknown |
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| Created | unknown |
| Name | OIG investigation into Alleged time and Attendance abuse by a Patent Examiner |
| Format | Web Resource |
| License | us-pd |
| Created | 5 years ago |
| has views | False |
| id | 56b00db8-84b9-4f32-805e-08b1c80eec85 |
| metadata modified | 5 years ago |
| package id | 88bd1a84-c680-4205-a958-9baeb7a99dbc |
| position | 0 |
| state | active |
| tracking summary | {'total': 2, 'recent': 2} |