OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner
OIG investigation into time and attendance abuse by a patent examiner
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OIG investigation into Alleged time and Attendance abuse by a Patent Examiner
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[ "006:05" ] |
| contactPoint |
{ "fn": "webmaster", "@type": "vcard:Contact", "hasEmail": "mailto:oigwebmaster@oig.doc.gov" } |
| description | OIG investigation into time and attendance abuse by a patent examiner |
| distribution |
[ { "@type": "dcat:Distribution", "title": "OIG investigation into Alleged time and Attendance abuse by a Patent Examiner", "accessURL": "https://www.oig.doc.gov/Pages/OIG-Investigation-into-Alleged-Time-and-Attendance-Abuse-by-a-Patent-Examiner.aspx", "description": "Department of Commerce OIG investigation into alleged time and attendance abuse by a Patent Examiner" } ] |
| identifier | doc-0001-b |
| keyword |
[ "OIG Investigation Patent examiner", "Time and attendance abuse investigation" ] |
| license | https://www.usa.gov/publicdomain/label/1.0/ |
| modified | 2015-08-19 |
| programCode |
[ "006:020" ] |
| publisher |
{ "name": "Office of Inspector General", "@type": "org:Organization" } |
| title | OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner |
