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    • OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner

    Metadata Updated: November 12, 2020

    OIG investigation into time and attendance abuse by a patent examiner

    Access & Use Information

    Public: This dataset is intended for public access and use. License: us-pd

    Downloads & Resources

    Dates

    Metadata Created Date November 12, 2020
    Metadata Updated Date November 12, 2020

    Metadata Source

    Harvested from Commerce Non Spatial Data.json Harvest Source

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date November 12, 2020
    Metadata Updated Date November 12, 2020
    Publisher Office of Inspector General
    Maintainer
    Identifier doc-0001-b
    Data Last Modified 2015-08-19
    Public Access Level public
    Bureau Code 006:05
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Harvest Object Id 7f7a6f66-d7c5-4b2a-a4b2-e75cfcaa6c2d
    Harvest Source Id bce99b55-29c1-47be-b214-b8e71e9180b1
    Harvest Source Title Commerce Non Spatial Data.json Harvest Source
    License https://www.usa.gov/publicdomain/label/1.0/
    Program Code 006:020
    Source Datajson Identifier True
    Source Hash 1a5e962eeacf48e22b20aa8081e9baecf8ba2e1b
    Source Schema Version 1.1

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