{"@type": "dcat:Dataset", "accessLevel": "public", "bureauCode": ["006:05"], "contactPoint": {"@type": "vcard:Contact", "fn": "webmaster", "hasEmail": "mailto:oigwebmaster@oig.doc.gov"}, "description": "OIG investigation into time and attendance abuse by a patent examiner", "distribution": [{"@type": "dcat:Distribution", "accessURL": "https://www.oig.doc.gov/Pages/OIG-Investigation-into-Alleged-Time-and-Attendance-Abuse-by-a-Patent-Examiner.aspx", "description": "Department of Commerce OIG investigation into alleged time and attendance abuse by a Patent Examiner", "title": "OIG investigation into Alleged time and Attendance abuse by a Patent Examiner"}], "identifier": "doc-0001-b", "keyword": ["OIG Investigation Patent examiner", "Time and attendance abuse investigation"], "license": "https://www.usa.gov/publicdomain/label/1.0/", "modified": "2015-08-19", "programCode": ["006:020"], "publisher": {"@type": "org:Organization", "name": "Office of Inspector General"}, "title": "OIG Investigation Into Alleged Time and Attendance Abuse by a Patent Examiner"}