Evaluation of a new Prototype of Secondary Voltage Standard with a Programmable Josephson Voltage Standard
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5 resources available
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Read Me file
TXT -
Fig 1 AD and voltage stability
CSV -
Fig 2 Long-term stability.csv
CSV -
Fig 3 DAC INL results.csv
CSV -
Fig 4 DAC 100 mV voltage stability.csv
CSV
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[ "006:55" ] |
| contactPoint |
{ "fn": "Alain Rufenacht", "hasEmail": "mailto:alain.rufenacht@nist.gov" } |
| description | This paper evaluates the short-term and long-term performance of a new type of dc secondary voltage standard at 10 V by direct comparison to a programmable Josephson voltage standard. Allan deviation measurements indicated a noise floor of 4.5 nV, enabling potential new applications in voltage metrology and possibly reducing uncertainty along the dissemination chain from primary calibration laboratories to calibration laboratories. |
| distribution |
[ { "title": "Read Me file", "mediaType": "text/plain", "description": "Description of the data set", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/4087_README.txt" }, { "title": "Fig 1 AD and voltage stability", "mediaType": "text/csv", "description": "Figure 1 presents the Allan deviation (AD) results (Fig. 1a) obtained at 10 V and 100 mV, and stability of the 10 V output of the Z10 (Unit 1) over a 24-hour period (Fig. 1b) measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%201%20AD%20and%20voltage%20stability.csv" }, { "title": "Fig 2 Long-term stability.csv", "mediaType": "text/csv", "description": "Figure 2 presents Long-term stability data collected for the 10 V output voltage tap of two Z10 units (labelled Unit 1 and Unit 2) measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%202%20Long-term%20stability.csv" }, { "title": "Fig 3 DAC INL results.csv", "mediaType": "text/csv", "description": "Figure 3 presents the Integral Non-Linearity (INL) of the DAC output measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%203%20DAC%20INL%20results.csv" }, { "title": "Fig 4 DAC 100 mV voltage stability.csv", "mediaType": "text/csv", "description": "Figure 4 presents the stability of the DAC voltage output at 100 mV over a 24-hour period measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%204%20DAC%20100%20mV%20voltage%20stability.csv" } ] |
| identifier | ark:/88434/mds2-4087 |
| issued | 2026-03-17 |
| keyword |
[ "Digital-analog conversion", "Josephson junctions", "Measurement uncertainty", "Standards", "Superconducting integrated circuits", "Voltage measurement." ] |
| language |
[ "en" ] |
| license | https://www.nist.gov/open/license |
| modified | 2026-02-03 00:00:00 |
| programCode |
[ "006:045" ] |
| publisher |
{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" } |
| theme |
[ "Metrology:Electrical/electromagnetic metrology" ] |
| title | Evaluation of a new Prototype of Secondary Voltage Standard with a Programmable Josephson Voltage Standard |