{"@type": "dcat:Dataset", "accessLevel": "public", "bureauCode": ["006:55"], "contactPoint": {"fn": "Alain Rufenacht", "hasEmail": "mailto:alain.rufenacht@nist.gov"}, "description": "This paper evaluates the short-term and long-term performance of a new type of dc secondary voltage standard at 10 V by direct comparison to a programmable Josephson voltage standard. Allan deviation measurements indicated a noise floor of 4.5 nV, enabling potential new applications in voltage metrology and possibly reducing uncertainty along the dissemination chain from primary calibration laboratories to calibration laboratories.", "distribution": [{"description": "Description of the data set", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/4087_README.txt", "mediaType": "text/plain", "title": "Read Me file"}, {"description": "Figure 1 presents the Allan deviation (AD) results (Fig. 1a) obtained at 10 V and 100 mV, and stability of the 10 V output of the Z10 (Unit 1) over a 24-hour period (Fig. 1b) measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%201%20AD%20and%20voltage%20stability.csv", "mediaType": "text/csv", "title": "Fig 1 AD and voltage stability"}, {"description": "Figure 2 presents Long-term stability data collected for the 10 V output voltage tap of two Z10 units (labelled Unit 1 and Unit 2) measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%202%20Long-term%20stability.csv", "mediaType": "text/csv", "title": "Fig 2 Long-term stability.csv"}, {"description": "Figure 3 presents the Integral Non-Linearity (INL) of the DAC output measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%203%20DAC%20INL%20results.csv", "mediaType": "text/csv", "title": "Fig 3 DAC INL results.csv"}, {"description": "Figure 4 presents the stability of the DAC voltage output at 100 mV over a 24-hour period measured with the NIST Programmable Josephson Voltage Standard", "downloadURL": "https://data.nist.gov/od/ds/mds2-4087/Fig%204%20DAC%20100%20mV%20voltage%20stability.csv", "mediaType": "text/csv", "title": "Fig 4 DAC 100 mV voltage stability.csv"}], "identifier": "ark:/88434/mds2-4087", "issued": "2026-03-17", "keyword": ["Digital-analog conversion", "Josephson junctions", "Measurement uncertainty", "Standards", "Superconducting integrated circuits", "Voltage measurement."], "language": ["en"], "license": "https://www.nist.gov/open/license", "modified": "2026-02-03 00:00:00", "programCode": ["006:045"], "publisher": {"@type": "org:Organization", "name": "National Institute of Standards and Technology"}, "theme": ["Metrology:Electrical/electromagnetic metrology"], "title": "Evaluation of a new Prototype of Secondary Voltage Standard with a Programmable Josephson Voltage Standard"}