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Diffraction Data for SRM 640f

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Catalog Last Checked: August 02, 2025 at 02:18 PM | Dataset Last Updated: June 01, 2020
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.

Resources

3 resources available

  • DOI Access for Diffraction Data for SRM 640f

    FILE
  • X-ZIP-COMPRESSED

    Diffraction Data for SRM 640f

    APPLICATION/X-ZIP-COMPRESSED
  • SHA256 File for Diffraction Data for SRM 640f

    TEXT/PLAIN

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