Diffraction Data for SRM 640f
Resources
3 resources available
-
DOI Access for Diffraction Data for SRM 640f
FILE -
Diffraction Data for SRM 640f
APPLICATION/X-ZIP-COMPRESSED -
SHA256 File for Diffraction Data for SRM 640f
TEXT/PLAIN
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Complete Metadata
| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| bureauCode |
[ "006:55" ] |
| contactPoint |
{ "fn": "David R. Black", "hasEmail": "mailto:srms@nist.gov" } |
| description | The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format. |
| distribution |
[ { "title": "DOI Access for Diffraction Data for SRM 640f", "accessURL": "https://doi.org/10.18434/M32251" }, { "title": "Diffraction Data for SRM 640f", "mediaType": "application/x-zip-compressed", "description": "X-ray diffraction data expressed as intensity as a function of angle", "downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip" }, { "title": "SHA256 File for Diffraction Data for SRM 640f", "mediaType": "text/plain", "downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip.sha256" } ] |
| identifier | ark:/88434/mds2-2251 |
| issued | 2020-06-22 |
| keyword |
[ "Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM" ] |
| landingPage | https://data.nist.gov/od/id/mds2-2251 |
| language |
[ "en" ] |
| license | https://www.nist.gov/open/license |
| modified | 2020-06-01 00:00:00 |
| programCode |
[ "006:045" ] |
| publisher |
{ "name": "National Institute of Standards and Technology", "@type": "org:Organization" } |
| theme |
[ "Materials:Materials characterization" ] |
| title | Diffraction Data for SRM 640f |