{"@type": "dcat:Dataset", "accessLevel": "public", "bureauCode": ["006:55"], "contactPoint": {"fn": "David R. Black", "hasEmail": "mailto:srms@nist.gov"}, "description": "The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle.  Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.", "distribution": [{"accessURL": "https://doi.org/10.18434/M32251", "title": "DOI Access for Diffraction Data for SRM 640f"}, {"description": "X-ray diffraction data expressed as intensity as a function of angle", "downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip", "mediaType": "application/x-zip-compressed", "title": "Diffraction Data for SRM 640f"}, {"downloadURL": "https://data.nist.gov/od/ds/mds2-2251/srm640f_cifs_20200601a.zip.sha256", "mediaType": "text/plain", "title": "SHA256 File for Diffraction Data for SRM 640f"}], "identifier": "ark:/88434/mds2-2251", "issued": "2020-06-22", "keyword": ["Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM"], "landingPage": "https://data.nist.gov/od/id/mds2-2251", "language": ["en"], "license": "https://www.nist.gov/open/license", "modified": "2020-06-01 00:00:00", "programCode": ["006:045"], "publisher": {"@type": "org:Organization", "name": "National Institute of Standards and Technology"}, "theme": ["Materials:Materials characterization"], "title": "Diffraction Data for SRM 640f"}