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Data for "Targeted Chemical Pressure Yields Tunable Millimeter-Wave Dielectric "

Metadata Updated: July 29, 2022

Included here are figures and other relevant data from the paper "Targeted Chemical Pressure Yields Tunable Millimeter-Wave 5G Dielectric with Unparalleled Performance" published online in Nature Materials on 23 December 2019 (https://doi.org/10.1038/s41563-019-0564-4). Abstract: Epitaxial strain can unlock enhanced properties in oxide materials but restricts substrate choice and maximum film thickness, above which lattice relaxation and property degradation occur. Here we employ a chemical alternative to epitaxial strain by providing targeted chemical pressure, distinct from random doping, to induce a ferroelectric instability with the strategic introduction of barium into today's best millimeter-wave tunable dielectric, the epitaxially strained 50 nm thick n = 6 (SrTiO3)nSrO Ruddlesden-Popper grown on (110) DyScO3. The defect mitigating nature of (SrTiO3)nSrO results in unprecedented low loss at frequencies up to 125 GHz. No barium-containing Ruddlesden-Popper titanates are known, but this atomically-engineered superlattice material, (SrTiO3)n?m(BaTiO3)mSrO, enables low-loss, tunable dielectric properties to be achieved with lower epitaxial strain and a 200 % improvement in the figure of merit at commercially-relevant millimeter-wave frequencies. As tunable dielectrics are key constituents for emerging millimeter-wave high-frequency devices in telecommunications our findings could lead to higher performance adaptive and reconfigurable electronics at these frequencies.

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Public: This dataset is intended for public access and use. License: See this page for license information.

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Dates

Metadata Created Date March 11, 2021
Metadata Updated Date July 29, 2022

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date March 11, 2021
Metadata Updated Date July 29, 2022
Publisher National Institute of Standards and Technology
Maintainer
Identifier 7619E70B50E70FE5E05324570681A1921968
Data First Published 2019-11-22
Language en
Data Last Modified 2019-11-20 00:00:00
Category Electronics:Optoelectronics, Advanced Communications:Wireless (RF), Physics:Condensed matter, Metrology:Electrical/electromagnetic metrology, Materials:Materials characterization, Materials:Ceramics, Electronics:Thin-film electronics, Electronics:Electromagnetics
Public Access Level public
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id 8a45adeb-bc08-4da0-91b7-eab3c19c8fca
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL https://data.nist.gov/od/id/7619E70B50E70FE5E05324570681A1921968
License https://www.nist.gov/open/license
Program Code 006:045
Source Datajson Identifier True
Source Hash 563b6721a8873908f0af5ded289c9dd2a567edc2
Source Schema Version 1.1

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