Data for "Targeted Chemical Pressure Yields Tunable Millimeter-Wave Dielectric "
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README.txt
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Figure 1: DFT files for the Ba-containing STO...CIF
A .TGZ compressed folder containing the information necessary to reproduce...
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Figure 2: Data for the X-Ray Diffraction...CSV
This CSV file contains the raw data for the X-ray diffraction curves shown in...
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Figure 3(a): Data for the dielectric constant...CSV
This CSV file contains the raw data for the dielectric constant (K11) vs....
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Figure 3(b): Data for the ferroelectric...CSV
This CSV file contains the raw data for the ferroelectric transition...
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Figure 3(c): Data for the lattice parameter...CSV
This CSV file contains the raw data for the lattice parameter (a) / strain...
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Figure 3(d): Data for the energy vs. total...CSV
This CSV file contains the raw data for the energy vs. total ionic distortion...
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Figure 4(a): Data for the complex dielectric...CSV
This CSV file contains the raw data for the complex dielectric constant (K11)...
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Figure 4(a)[inset]: Data for the loss tangent...CSV
This CSV file contains the raw data for the loss tangent vs. frequency curves...
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Figure 4(b): Data for the dielectric constant...CSV
This CSV file contains the raw data for the dielectric constant tunability vs...
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Figure 4(c): Data for the figure of merit...CSV
This CSV file contains the raw data for the figure of merit (FOM) vs....
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DOI Access for Data for "Targeted Chemical...
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Dates
Metadata Created Date | March 11, 2021 |
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Metadata Updated Date | July 29, 2022 |
Metadata Source
- Data.json Data.json Metadata
Harvested from NIST
Additional Metadata
Resource Type | Dataset |
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Metadata Created Date | March 11, 2021 |
Metadata Updated Date | July 29, 2022 |
Publisher | National Institute of Standards and Technology |
Maintainer | |
Identifier | 7619E70B50E70FE5E05324570681A1921968 |
Data First Published | 2019-11-22 |
Language | en |
Data Last Modified | 2019-11-20 00:00:00 |
Category | Electronics:Optoelectronics, Advanced Communications:Wireless (RF), Physics:Condensed matter, Metrology:Electrical/electromagnetic metrology, Materials:Materials characterization, Materials:Ceramics, Electronics:Thin-film electronics, Electronics:Electromagnetics |
Public Access Level | public |
Bureau Code | 006:55 |
Metadata Context | https://project-open-data.cio.gov/v1.1/schema/data.json |
Schema Version | https://project-open-data.cio.gov/v1.1/schema |
Catalog Describedby | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
Harvest Object Id | 8a45adeb-bc08-4da0-91b7-eab3c19c8fca |
Harvest Source Id | 74e175d9-66b3-4323-ac98-e2a90eeb93c0 |
Harvest Source Title | NIST |
Homepage URL | https://data.nist.gov/od/id/7619E70B50E70FE5E05324570681A1921968 |
License | https://www.nist.gov/open/license |
Program Code | 006:045 |
Source Datajson Identifier | True |
Source Hash | 563b6721a8873908f0af5ded289c9dd2a567edc2 |
Source Schema Version | 1.1 |
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