Fig6bottom_SetupA_CPWwithoutJJs
URL: https://data.nist.gov/od/ds/mds2-3603/Fig6bottom_SetupA_CPWwithoutJJs.csv
Data used in Fig. 6 (bottom) of [1].Setup A, Chip A: Comparison of S-parameters for Chip A's CPW models (Sn,model), SOLR-calibrated measurements (Sn,SOLR), and the proposed MISL-calibrated measurements (Sn,MISL), using weights that prioritize transmission accuracy. Temperature-dependent resistivity variations in the 650 nm Nb wiring layer define seven distinct impedance states. The uncertainty for each state is represented by a shaded area in different colors. Bottom: Upper bound of the linear magnitude difference between SOLR- and MISL-calibrated S-parameters for all n.
Source: Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides
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