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    • Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides

    Metadata Updated: July 12, 2025

    These data will appear in [1]. The abstract for that paper is given below:This paper presents a new multi-impedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need for cryogenic switches or a cryogenic probe station. The method uses coplanar waveguide (CPW) models based on various impedance states of niobium (Nb), which has zero dc resistance below 9 K and a monotonically increasing resistance from 10 K to room temperature. The different impedance states are accessed by heating the 4 K stage of a cryostat and injecting up to 245 mA of current into the line. Using these states, we solve for the unknowns in an 8-term error model through a least-squares analysis. We first validate the MISL calibration technique by comparing it with short-open-load-reciprocal (SOLR) calibrated measurements in a cryogenic probe station, finding transmission agreement within 0.2 dB and uncertainty overlap for nearly all frequencies up to 26.5 GHz. We then apply the method to calibrate Nb CPWs with and without embedded Josephson junctions (JJs), using a fixed wire bonded connection, and without the use of cryogenic switches or movable probes. Strong agreement with the CPW models is demonstrated, with uncertainty overlap and differences below 0.1 dB up to 4.6 GHz without JJs and up to 2.4 GHz with JJs; resonances cause interruptions beyond these frequencies.[1] Thomas, J. N., Hoffmann, J., Flowers-Jacobs, N. E., Fox, A. E., Jungwirth, N. R., Johnson-Wilke, R. L., Dresselhaus, P. D., & Benz, S. P., "Cryogenic On-chip In Situ S-parameter Calibration Using Superconducting Coplanar Waveguides" submitted to the IEEE Transactions on Microwave Theory and Techniques Journal which if accepted will be published and available on IEEE website at a later date.

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    Public: This dataset is intended for public access and use. License: See this page for license information.

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    Dates

    Metadata Created Date March 14, 2025
    Metadata Updated Date July 12, 2025

    Metadata Source

    Harvested from NIST

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date March 14, 2025
    Metadata Updated Date July 12, 2025
    Publisher National Institute of Standards and Technology
    Maintainer
    Identifier ark:/88434/mds2-3603
    Data First Published 2024-12-12
    Language en
    Data Last Modified 2025-06-30 00:00:00
    Category Metrology:Electrical/electromagnetic metrology, Electronics:Superconducting electronics
    Public Access Level public
    Bureau Code 006:55
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Harvest Object Id 5ad24215-9b65-40f1-9937-4845db9947fc
    Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
    Harvest Source Title NIST
    Homepage URL https://data.nist.gov/od/id/mds2-3603
    License https://www.nist.gov/open/license
    Program Code 006:045
    Source Datajson Identifier True
    Source Hash c61bb7cce42afa4c38d7d85d24ee0876a8ea0f1ab829efbbcf6417a2bc8cd745
    Source Schema Version 1.1

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