Data Catalog

• Federal

  Data for A Dual Mode Brillouin/Low-Frequency Raman Spectroscopy Microscope for Local Mechanical Property Imaging for Semiconductor Packaging Materials

  National Institute of Standards and Technology —

  The processed spectroscopic and experimental conditions (as applicable) data which are used to construct each figure is provided.

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  • 65 more in dataset
• Federal

  Data for A Dual Mode Brillouin/Low-Frequency Raman Spectroscopy Microscope for Local Mechanical Property Imaging for Semiconductor Packaging Materials

  Department of Commerce —

  The processed spectroscopic and experimental conditions (as applicable) data which are used to construct each figure is provided.

  • TEXT
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  • 65 more in dataset

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