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Federal
On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz
National Institute of Standards and Technology —
data published in paper "On-Wafer Device Characterization Including Uncertainty Estimates to 1.0 THz"This dataset contains the calibrated scattering parameters...- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are three sections. 1. Measured capacitance of Tech. 1 and Tech. 2 series capacitors. 2. Simulated capacitance of the the Tech 1. series capacitor. 3. Simulated capacitance of the Tech 2. series capacitor. Commented lines start with a % sign. Data lines are space delimited.
- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are two sections. 1st section is the measured data and 2nd section is the simulated data. Commented lines start with a % sign. Data lines are space delimited.
- There are three sections. 1. Measured capacitance of Tech. 1 and Tech. 2 shunt capacitors. 2. Simulated capacitance of the the Tech 1. shunt capacitor. 3. Simulated capacitance of the Tech 2. shunt capacitor. Commented lines start with a % sign. Data lines are space delimited.
- 4 more in dataset
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Federal
Simulations for Entropy Scaling Behavior of Molecular Models of Molten Salts
National Institute of Standards and Technology —
Parameters, input scripts, and molecular dynamics simulation results corresponding to the simulations performed for the paper "Entropy Scaling for Viscosity for... -
Federal
Data and input files associated with "Bloch-state optimal basis sets: An efficient approach for electronic structure interpolation"
National Institute of Standards and Technology —
Data and input files for publication "Bloch-state optimal basis sets: An efficient approach for electronic structure interpolation" -
Federal
SRM 3151 Silver (Ag) Standard Solution Lot No. 160729
National Institute of Standards and Technology —
This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of silver. A unit of SRM 3151 consists... -
Federal
SRM 3131a Magnesium (Mg) Standard Solution Lot 140110
National Institute of Standards and Technology —
This Standard Reference Material (SRM) is intended for use as a primary calibration standard for the quantitative determination of magnesium. A unit of SRM 3131a... -
Federal
Small-Signal Model Verification and Analysis of Unmatched Multi-Finger HBT Cells at 220 GHz
National Institute of Standards and Technology —
This dataset contains the simulated and calibrated measured scattering parameters (S-parameters) of a via, a short-circuit manifold test structure, a single... -
Federal
Data for manuscript entitled "Compact dual comb time-transfer and ranging for future space-based distributed sensing"
National Institute of Standards and Technology —
Data for the figures in the manuscript entitled "Compact dual comb time-transfer and ranging for future space-based distributed sensing" published in Applied Optics.... -
Federal
Dataset from Steel-Concrete Composite Floor Systems Subject to Fire - Phase 1
National Institute of Standards and Technology —
Experimental fire tests were conducted on four 12.8 m long steel-concrete composite floor beam assemblies with varying end support conditions, including two types of... -
Federal
CENDI-DCDG Reproducibility Resource Analysis Data
National Institute of Standards and Technology —
Data from an exercise conducted by a group of federal library and data information managers who are part of the interagency CENDI Data Curation Discussion Group...