Data Catalog

• Federal

  Data associated with "Characterizing the broadband RF permittivity of 3D-integrated layers in a glass wafer stack from 100 MHz to 30 GHz" for the 2024 International Microwave Symposium (IMS) in Washington, D.C.

  National Institute of Standards and Technology —

  We present a method for accurately determining the permittivity of dielectric materials in 3D integrated structures at broadband RF frequencies. With applications of...

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• Federal

  **SUPERSEDED** Software and Data for Modeling OFDM Communication Signals with Generative Adversarial Networks

  National Institute of Standards and Technology —

  This software and data have been superseded. Please visit https://doi.org/10.18434/mds2-2532

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