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#1 Federal
Diffraction Data for SRM 660c
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: October 29, 2020
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a...
- ZIP
- TXT
Search relevance: 221.12 | Views last month: 3 | Catalog Last Checked: September 10, 2026 at 05:51 PM
#2 Federal
Diffraction Data for SRM 660c
- Organization: Department of Commerce
- Dataset Last Updated: October 29, 2020
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a...
- ZIP
- TXT
Search relevance: 216.96 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:52 PM

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