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Diffraction Data for SRM 660c

Metadata Updated: July 29, 2022

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite analyzer, and is stored in CIF format.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

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Metadata Created Date June 22, 2022
Metadata Updated Date July 29, 2022

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date June 22, 2022
Metadata Updated Date July 29, 2022
Publisher National Institute of Standards and Technology
Identifier ark:/88434/mds2-2315
Data First Published 2022-03-16
Language en
Data Last Modified 2020-10-29 00:00:00
Category Materials:Materials characterization
Public Access Level public
Bureau Code 006:55
Metadata Context
Schema Version
Catalog Describedby
Harvest Object Id 584b609b-467f-4c31-bf7a-d9497313a801
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Program Code 006:045
Related Documents
Source Datajson Identifier True
Source Hash d37dd067f0d9573407b631f9f5c0cb67ec930400
Source Schema Version 1.1

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