Diffraction Data for SRM 660c

Metadata Updated: July 29, 2022

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite analyzer, and is stored in CIF format.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

SHA256 File for zip archive of CIF datasets...TEXT

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zip archive of CIF datasets from the SRM 660c...zip file of IUCr Crystallographic Information File (CIF) datasets
These CIFs have the original data used to certify SRM660c, along with fits to...

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References

https://doi.org/10.1017/S0885715620000068

Dates

Metadata Created Date	June 22, 2022
Metadata Updated Date	July 29, 2022

Metadata Source

Data.json Data.json Metadata
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Harvested from NIST

Additional Metadata

Resource Type	Dataset
Metadata Created Date	June 22, 2022
Metadata Updated Date	July 29, 2022
Publisher	National Institute of Standards and Technology
Maintainer	David R. Black
Identifier	ark:/88434/mds2-2315
Data First Published	2022-03-16
Language	en
Data Last Modified	2020-10-29 00:00:00
Category	Materials:Materials characterization
Public Access Level	public
Bureau Code	006:55
Metadata Context	https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version	https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby	https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id	584b609b-467f-4c31-bf7a-d9497313a801
Harvest Source Id	74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title	NIST
License	https://www.nist.gov/open/license
Program Code	006:045
Related Documents	https://doi.org/10.1017/S0885715620000068
Source Datajson Identifier	True
Source Hash	d37dd067f0d9573407b631f9f5c0cb67ec930400
Source Schema Version	1.1

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