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#1 Federal
Diffraction Data for SRM 640f
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: June 01, 2020
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and...
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Search relevance: 309.34 | Views last month: 2 | Catalog Last Checked: September 10, 2026 at 05:51 PM
#2 Federal
Diffraction Data for SRM 640f
- Organization: Department of Commerce
- Dataset Last Updated: June 01, 2020
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and...
- FILE
- ZIP
- TXT
Search relevance: 308.19 | Views last month: 0 | Catalog Last Checked: October 02, 2026 at 07:52 PM

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