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#1 Federal
Data to accompany "Low Electron Beam Energy X-ray Microanalysis: The Adventure Continues!"
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: December 06, 2022
EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with...
- ZIP
Search relevance: 1.00 | Views last month: 11 | Catalog Last Checked: September 02, 2026 at 07:18 PM
#2 Federal
Data associated with Newbury & Ritchie "Testing the Accuracy of Low Beam Energy Electron-Excited X-ray Microanalysis with Energy Dispersive Spectrometry "
- Organization: National Institute of Standards and Technology
- Dataset Last Updated: April 18, 2024
Data supporting: "The accuracy of electron-excited X-ray microanalysis with energy dispersive spectrometry (EDS) has been tested in the low beam energy range, specifically at an incident beam...
- EMSA
- ADOB
- ASCI
- FILE
Search relevance: 1.00 | Views last month: 0 | Catalog Last Checked: September 02, 2026 at 07:18 PM

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