Towards A Model-based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging
A remaining useful life prediction methodology for elec- trolytic capacitors is presented. This methodology adopts a Kalman filter approach in conjunction with an empirical state-based degradation model to predict the degradation of capacitor parameters through the life of the capacitor. Elec- trolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are good candi- dates for component level prognostics and health manage- ment. Prognostics provides a way to assess remaining use- ful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. This paper discusses the empirical degradation models and experi- mental results of an accelerated aging test performed on a set of identical capacitors subjected to electrical stress. The data form the basis for developing the Kalman-filter based remain- ing life prediction algorithm.
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| @type | dcat:Dataset |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode |
[ "026:00" ] |
| contactPoint |
{ "fn": "Miryam Strautkalns", "@type": "vcard:Contact", "hasEmail": "mailto:miryam.strautkalns@nasa.gov" } |
| description | A remaining useful life prediction methodology for elec- trolytic capacitors is presented. This methodology adopts a Kalman filter approach in conjunction with an empirical state-based degradation model to predict the degradation of capacitor parameters through the life of the capacitor. Elec- trolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are good candi- dates for component level prognostics and health manage- ment. Prognostics provides a way to assess remaining use- ful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. This paper discusses the empirical degradation models and experi- mental results of an accelerated aging test performed on a set of identical capacitors subjected to electrical stress. The data form the basis for developing the Kalman-filter based remain- ing life prediction algorithm. |
| distribution |
[ { "@type": "dcat:Distribution", "title": "2012_IJPHM_Capacitor.pdf", "format": "PDF", "mediaType": "application/pdf", "description": "2012_IJPHM_Capacitor.pdf", "downloadURL": "https://c3.nasa.gov/dashlink/static/media/publication/2012_IJPHM_Capacitor.pdf" } ] |
| identifier | DASHLINK_761 |
| issued | 2013-06-19 |
| keyword |
[ "ames", "dashlink", "nasa" ] |
| landingPage | https://c3.nasa.gov/dashlink/resources/761/ |
| modified | 2025-03-31 |
| programCode |
[ "026:029" ] |
| publisher |
{ "name": "Dashlink", "@type": "org:Organization" } |
| title | Towards A Model-based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging |
