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h. SEM Images of Sinter Thin Sections

Published by U.S. Geological Survey | Department of the Interior | Catalog Last Checked: August 01, 2026 at 05:57 AM | Dataset Last Updated: March 25, 2026 at 12:00 AM
Sample Analyses: Thin sections made at UC Berkeley were brought to the USGS, Menlo Park, CA and were coated with 25 nm carbon. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 50 mm2 X-MaxN energy dispersive spectrometer. Thin sections were imaged with backscatter electrons. Database Contents: The data files for “SEM Images of Sinter Thin Sections” contain representative SEM images of thin sections of samples UGB-TD-24, -27, -28, -29, -31, -32.

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