Prognostication of Residual Life and Latent Damage Assessment in Lead-free Electronics Under Thermo-Mechanical Loads
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Downloads & Resources
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2010_IEEE_TIE_ThermoMechanicalLoad.pdfPDF
2010_IEEE_TIE_ThermoMechanicalLoad.pdf
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Landing PageLanding Page
Dates
Metadata Created Date | November 12, 2020 |
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Metadata Updated Date | December 6, 2023 |
Data Update Frequency | irregular |
Metadata Source
- Data.json Data.json Metadata
Harvested from NASA Data.json
Additional Metadata
Resource Type | Dataset |
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Metadata Created Date | November 12, 2020 |
Metadata Updated Date | December 6, 2023 |
Publisher | Dashlink |
Maintainer | |
Identifier | DASHLINK_756 |
Data First Published | 2013-06-19 |
Data Last Modified | 2020-01-29 |
Public Access Level | public |
Data Update Frequency | irregular |
Bureau Code | 026:00 |
Metadata Context | https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld |
Metadata Catalog ID | https://data.nasa.gov/data.json |
Schema Version | https://project-open-data.cio.gov/v1.1/schema |
Catalog Describedby | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
Harvest Object Id | 046b6796-0525-4ac5-a0a3-5301659e2267 |
Harvest Source Id | 58f92550-7a01-4f00-b1b2-8dc953bd598f |
Harvest Source Title | NASA Data.json |
Homepage URL | https://c3.nasa.gov/dashlink/resources/756/ |
Program Code | 026:029 |
Source Datajson Identifier | True |
Source Hash | a4e7415455f26c80b2fba89f470a65ef460451fd00fc9b0143887395daa527e9 |
Source Schema Version | 1.1 |
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