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On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures

Metadata Updated: May 9, 2023

This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE)

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

References

https://dx.doi.org/10.1109/JMW.2022.3232076

Dates

Metadata Created Date May 9, 2023
Metadata Updated Date May 9, 2023
Data Update Frequency irregular

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date May 9, 2023
Metadata Updated Date May 9, 2023
Publisher National Institute of Standards and Technology
Maintainer
Identifier ark:/88434/mds2-2824
Data First Published 2023-04-07
Language en
Data Last Modified 2022-10-22 00:00:00
Category Electronics:Superconducting electronics, Electronics:Electromagnetics
Public Access Level public
Data Update Frequency irregular
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id 0b29180b-5a6c-44eb-a917-35e22195b2a8
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL https://data.nist.gov/od/id/mds2-2824
License https://www.nist.gov/open/license
Program Code 006:045
Related Documents https://dx.doi.org/10.1109/JMW.2022.3232076
Source Datajson Identifier True
Source Hash f46e70de061e05b8cbb943e4c9cc39074f53fbba
Source Schema Version 1.1

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