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On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Catalog Last Checked: August 02, 2025 at 03:02 PM | Dataset Last Updated: October 22, 2022
This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE)

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Complete Metadata
@type dcat:Dataset
accessLevel public
accrualPeriodicity irregular
bureauCode 
[
  "006:55"
]
contactPoint 
{
  "fn": "Dylan Williams",
  "hasEmail": "mailto:dylan.williams@nist.gov"
}
description This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE)
distribution 
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identifier ark:/88434/mds2-2824
issued 2023-04-07
keyword 
[
  "Microwave calibrations",
  "cryogenic",
  "dilution refrigerator",
  "on-wafer measurement",
  "vector network analysis."
]
landingPage https://data.nist.gov/od/id/mds2-2824
language 
[
  "en"
]
license https://www.nist.gov/open/license
modified 2022-10-22 00:00:00
programCode 
[
  "006:045"
]
publisher 
{
  "name": "National Institute of Standards and Technology",
  "@type": "org:Organization"
}
references 
[
  "https://dx.doi.org/10.1109/JMW.2022.3232076"
]
theme 
[
  "Electronics:Electromagnetics",
  "Electronics:Superconducting electronics"
]
title On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures

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