On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
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Landing PageLanding Page
References
https://dx.doi.org/10.1109/JMW.2022.3232076 |
Dates
Metadata Created Date | May 9, 2023 |
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Metadata Updated Date | May 9, 2023 |
Data Update Frequency | irregular |
Metadata Source
- Data.json Data.json Metadata
Harvested from NIST
Additional Metadata
Resource Type | Dataset |
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Metadata Created Date | May 9, 2023 |
Metadata Updated Date | May 9, 2023 |
Publisher | National Institute of Standards and Technology |
Maintainer | |
Identifier | ark:/88434/mds2-2824 |
Data First Published | 2023-04-07 |
Language | en |
Data Last Modified | 2022-10-22 00:00:00 |
Category | Electronics:Superconducting electronics, Electronics:Electromagnetics |
Public Access Level | public |
Data Update Frequency | irregular |
Bureau Code | 006:55 |
Metadata Context | https://project-open-data.cio.gov/v1.1/schema/data.json |
Schema Version | https://project-open-data.cio.gov/v1.1/schema |
Catalog Describedby | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
Harvest Object Id | 0b29180b-5a6c-44eb-a917-35e22195b2a8 |
Harvest Source Id | 74e175d9-66b3-4323-ac98-e2a90eeb93c0 |
Harvest Source Title | NIST |
Homepage URL | https://data.nist.gov/od/id/mds2-2824 |
License | https://www.nist.gov/open/license |
Program Code | 006:045 |
Related Documents | https://dx.doi.org/10.1109/JMW.2022.3232076 |
Source Datajson Identifier | True |
Source Hash | f46e70de061e05b8cbb943e4c9cc39074f53fbba |
Source Schema Version | 1.1 |
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