Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Skip to content
  • Feedback

    • Modeling SiO2 Ion Impurities Aging in Insulated Gate Power Devices Under Temperature and Voltage Stress

    Metadata Updated: April 11, 2025

    This paper presents a formal computational methodology to explain how the oxide in semiconductors degrades over time and the dependence of oxide degradation on voltage and temperature stresses. The effects of aging are modeled and quantified by modification of the gate-source capacitance value. The model output is validated using experimental results of a thermally aged power semiconductor device.

    Access & Use Information

    Public: This dataset is intended for public access and use. License: No license information was provided. If this work was prepared by an officer or employee of the United States government as part of that person's official duties it is considered a U.S. Government Work.

    Downloads & Resources

    Dates

    Metadata Created Date November 12, 2020
    Metadata Updated Date April 11, 2025
    Data Update Frequency irregular

    Metadata Source

    Harvested from NASA Data.json

    Other Data Resources

    Additional Metadata

    Resource Type Dataset
    Metadata Created Date November 12, 2020
    Metadata Updated Date April 11, 2025
    Publisher Dashlink
    Maintainer
    Identifier DASHLINK_866
    Data First Published 2013-12-18
    Data Last Modified 2025-04-01
    Public Access Level public
    Data Update Frequency irregular
    Bureau Code 026:00
    Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
    Schema Version https://project-open-data.cio.gov/v1.1/schema
    Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
    Harvest Object Id b4e8a25c-161a-4114-bee4-e49e6de020dd
    Harvest Source Id 58f92550-7a01-4f00-b1b2-8dc953bd598f
    Harvest Source Title NASA Data.json
    Homepage URL https://c3.nasa.gov/dashlink/resources/866/
    Program Code 026:029
    Source Datajson Identifier True
    Source Hash 83cffae431836305c9f96793c3175f9d90bc9a8a079c998b5cbc7e9ee241d244
    Source Schema Version 1.1

    Didn't find what you're looking for? Suggest a dataset here.