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Long term drift of the baseline-corrected, Voltage to Frequency conversion factor, observed in a Commercial-Off-the-Shelf Voltage-Controlled Crystal Oscillator.

Metadata Updated: July 9, 2025

Two column data of baseline-corrected sensitivity-drift (in units of PPM) of a Commercial-Off-the-Shelf VC/OCXO with respect to time (in units of years). The dataset spans about 0.7 years. Two spreadsheets are included in the workbook. The spreadsheet titled "Raw Data w. gaps 'as-collected'" contains the raw drift data, without any gap-filling. This shows the aging of a VC/OCXO's baseline-corrected sensitivity to constant input voltage. Text entries of "gap" in these numeric data arrays denote breaks in the data collection process attributable to other demands on the facility. The spreadsheet titled "Gap-filled data set" is needed for performing Allan variance analysis. Gaps in the data were mitigated by employing the technique outlined in D. A. Howe, C. Champagne and N. Schlossberger, "A Total Imputation Algorithm that Fills Gaps in Time Series Measurements for ADEV and Phase Noise Characterizations of Power-law Noise Models," 2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS), Paris, France, 2022, pp. 1-2, doi: 10.1109/EFTF/IFCS54560.2022.9850921.

Access & Use Information

Public: This dataset is intended for public access and use. License: See this page for license information.

Downloads & Resources

Dates

Metadata Created Date July 9, 2025
Metadata Updated Date July 9, 2025
Data Update Frequency irregular

Metadata Source

Harvested from NIST

Additional Metadata

Resource Type Dataset
Metadata Created Date July 9, 2025
Metadata Updated Date July 9, 2025
Publisher National Institute of Standards and Technology
Maintainer
Identifier ark:/88434/mds2-3747
Data First Published 2025-04-03
Language en
Data Last Modified 2024-07-19 00:00:00
Category Metrology:Electrical/electromagnetic metrology
Public Access Level public
Data Update Frequency irregular
Bureau Code 006:55
Metadata Context https://project-open-data.cio.gov/v1.1/schema/data.json
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id f7083abb-e674-4678-9878-93201ec5006e
Harvest Source Id 74e175d9-66b3-4323-ac98-e2a90eeb93c0
Harvest Source Title NIST
Homepage URL https://data.nist.gov/od/id/mds2-3747
License https://www.nist.gov/open/license
Program Code 006:045
Source Datajson Identifier True
Source Hash a6b84808d667ba64540e59386d384c193922cf861b65fc596b6b906ec7f47918
Source Schema Version 1.1

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